Advantages of XRF Analysis

                                                                   Advantages of XRF Analysis

What are the advantages of measuring lead concentration with a field-portable XRF (FP-XRF) instrument?

When lead is the main element of potential concern, analysis of samples by FP-XRF (and fixed-base XRF) instruments can offer considerable reductions in cost and time compared to standard CLP methods. Average sample throughput for ex situ (see third FAQ below for definition) analysis generally varies from 50 to 100 samples per day, depending on the number of analytes, the particular analyzer used, and the soil preparation protocol. In situ (see third FAQ below for definition) analysis allows a greater number of analyses at a given site because little or no sample preparation is performed; however, the loss of precision and accuracy in this mode of operation precludes quantitative site characterization. With FP-XRF instruments, measurements of soil lead concentration can be generated in real-time, allowing decision making in the field regarding the need for additional sampling or further remediation (provided that proper QC procedures are followed -see below). Another advantage of FP-XRF analysis over standard laboratory analysis is that the procedure does not generate investigation-derived waste, because it does not require solvent or acid extraction techniques that are employed by laboratory methods.

How is a FP-XRF instrument used to measure lead concentration in soil? Some FP-XRF instruments can be placed directly on the soil surface for in situ measurements. The FPXRF instrument measures the metal content of the sample over a surface area of approximately one square centimeter (1 cm²) to a depth of approximately 2 millimeters (2 mm), displaying lead concentration in parts per million (ppm). Other FP-XRF instruments require that soil samples are collected and placed in a sample cup that is then placed in a covered sample chamber for analysis (ex situ analysis). Most FP-XRF instruments can perform both in situ and ex situ analyses. Because of limitations on precision and accuracy, in situ analysis provides qualitative results. By contrast, ex situ analysis can provide semi-quantitative or quantitative results, depending upon the amount of preparation of the soil sample prior to analysis and the calibration standards used. Due to the inherent heterogeneity of soil, ex situ analysis is the preferred method because the soil can be homogenized to provide a sample that is more representative of the concentration of lead at the location from which it was collected.

Advantages of XRF Analysis

• Non-destructive analysis method

• Analyzes small solder joints

• Focal distance of .2mm spot analysis

• Able to differentiate layer thickness

• With known stack-up structure, we are able to program system to examine each layer

• Automated system to look at one joint of every component to ensure RoHS compliance

• System designed to exclude interval leaded constituents and does not include the interfacial aspects of the

components, but only the external solder surfaces, joint and board layers

use

XRF is a non-destructive elemental analysis technique which utilizes the emission of characteristic secondary X-rays from atoms of a material. This technique can be used to analyze the minerals, metals,